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24 Treffer
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Effects of sidewall spacer layers on thermal and low frequency noise performance of SOI UTB MOSFETs.In: Microsystem Technologies, Jg. 28 (2022-03-01), Heft 3, S. 653-658Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-02-01), Heft 2, S. 497-502academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 65 (2018-03-01), Heft 3, S. 895-900academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-11-01), Heft 11, S. 4615-4621academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-10-01), Heft 10, S. 3986-3990academicJournalZugriff:
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In: Superlattices & Microstructures, Jg. 101 (2017), S. 362-372Online academicJournal
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In: Materials Science in Semiconductor Processing, Jg. 31 (2015-03-01), S. 175-183Online academicJournal
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In: Superlattices & Microstructures, Jg. 75 (2014-11-01), S. 118-126Online academicJournal
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In: Solid-State Electronics, Jg. 99 (2014-09-01), S. 65-77Online academicJournal
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In: Solid-State Electronics, Jg. 95 (2014-05-01), S. 52-60Online academicJournal
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In: Solid-State Electronics, Jg. 91 (2014), S. 28-35Online academicJournal
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012), Heft 1, S. 247-251academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 58 (2011-03-01), Heft 3, S. 600-608academicJournalZugriff:
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In: Solid-State Electronics, Jg. 57 (2011-03-01), Heft 1, S. 61-66Online academicJournal
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In: Solid-State Electronics, Jg. 54 (2010-05-01), Heft 5, S. 545-551Online academicJournal
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In: Solid-State Electronics, Jg. 53 (2009-05-01), Heft 5, S. 540-547Online academicJournal
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In: Solid-State Electronics, Jg. 52 (2008-12-01), Heft 12, S. 1867-1871Online academicJournal
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In: Molecular Simulation, Jg. 34 (2008), Heft 1, S. 63-72academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 54 (2007-05-01), Heft 5, S. 1125-1131academicJournalZugriff:
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In: Solid-State Electronics, Jg. 51 (2007-04-01), Heft 4, S. 611-616Online academicJournal