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Thema
- atomic layer deposition 3 Treffer
- effective mass 3 Treffer
- engineered materials, dielectrics and plasmas 3 Treffer
- mosfets 3 Treffer
- silicon 3 Treffer
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39 weitere Werte:
- band structures 2 Treffer
- computing and processing 2 Treffer
- electrostatics 2 Treffer
- lattices 2 Treffer
- linear discriminant analysis 2 Treffer
- potential well 2 Treffer
- semiconductor films 2 Treffer
- semiconductor thin films 2 Treffer
- temperature distribution 2 Treffer
- thin film devices 2 Treffer
- tight binding 2 Treffer
- transistors 2 Treffer
- band structure 1 Treffer
- bandstructure 1 Treffer
- carrier mobility 1 Treffer
- conferences 1 Treffer
- density of states (dos) 1 Treffer
- device simulation 1 Treffer
- electron mobility 1 Treffer
- electron traps 1 Treffer
- fets 1 Treffer
- gallium arsenide 1 Treffer
- germanium 1 Treffer
- hemts 1 Treffer
- iii-v semiconductor materials 1 Treffer
- indium antimonide (insb) 1 Treffer
- interface traps 1 Treffer
- logic gates 1 Treffer
- modfets 1 Treffer
- mos devices 1 Treffer
- passivation 1 Treffer
- power, energy and industry applications 1 Treffer
- radiation 1 Treffer
- signal processing and analysis 1 Treffer
- temperature dependence 1 Treffer
- threshold voltage 1 Treffer
- ultrathin body (utb) 1 Treffer
- ultra-thin body (utb) 1 Treffer
- utb 1 Treffer
Publikation
- 2005 international semiconductor device research symposium, semiconductor device research symposium, 2005 international 2 Treffer
- ieee transactions on nanotechnology, nanotechnology, ieee transactions on, ieee trans. nanotechnology 2 Treffer
- 2021 joint international eurosoi workshop and international conference on ultimate integration on silicon (eurosoi-ulis), ultimate integration on silicon (eurosoi-ulis), 2021 joint international eurosoi workshop and international conference on 1 Treffer
- ieee transactions on device and materials reliability, device and materials reliability, ieee transactions on, ieee trans. device mater. relib. 1 Treffer
Inhaltsanbieter
6 Treffer
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In: IEEE Transactions on Device and Materials Reliability, Jg. 24 (2024-06-01), Heft 2, S. 225-232academicJournalZugriff:
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In: IEEE Transactions on Nanotechnology, Jg. 22 (2023), S. 8-13academicJournalZugriff:
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In: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), 2021-09-01, S. 1-4KonferenzZugriff:
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In: IEEE Transactions on Nanotechnology, Jg. 6 (2007), Heft 1, S. 101-105academicJournalZugriff:
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In: 2005 International Semiconductor Device Research Symposium, 2005, S. 358-359KonferenzZugriff:
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In: 2005 International Semiconductor Device Research Symposium, 2005, S. 384-385KonferenzZugriff: