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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-09-01), Heft 9, S. 4828-4834academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-02-01), Heft 2, S. 497-502academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 65 (2018-03-01), Heft 3, S. 895-900academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012-04-01), Heft 4, S. 941-948academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012), Heft 1, S. 247-251academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 58 (2011-03-01), Heft 3, S. 600-608academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 55 (2008-05-01), Heft 5, S. 1203-1210academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 54 (2007-05-01), Heft 5, S. 1125-1131academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 52 (2005-11-01), Heft 11, S. 2430-2439academicJournalZugriff: