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In: 10th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors - DRIP-X, Batz-sur-Mer, France, 29th September-2nd October, 2003, Jg. 27 (2004), Heft 1-3, S. 375-377KonferenzZugriff:
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In: 10th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors - DRIP-X, Batz-sur-Mer, France, 29th September-2nd October, 2003, Jg. 27 (2004), Heft 1-3, S. 177-179KonferenzZugriff:
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In: 10th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors - DRIP-X, Batz-sur-Mer, France, 29th September-2nd October, 2003, Jg. 27 (2004), Heft 1-3, S. 407-409KonferenzZugriff:
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In: EPJ. Applied physics (Print), Jg. 7 (1999), Heft 1, S. 13-17academicJournalZugriff: