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11 Treffer
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In: IEEE electron device letters, Jg. 27 (2006), Heft 4, S. 284-287academicJournalZugriff:
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In: IEEE electron device letters, Jg. 30 (2009), Heft 5, S. 541-543academicJournalZugriff:
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In: IEEE electron device letters, Jg. 29 (2008), Heft 1, S. 125-127academicJournalZugriff:
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In: IEEE electron device letters, Jg. 26 (2005), Heft 9, S. 661-663academicJournalZugriff:
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In: IEEE electron device letters, Jg. 26 (2005), Heft 11, S. 836-838academicJournalZugriff:
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In: IEEE electron device letters, Jg. 29 (2008), Heft 1, S. 125-127serialPeriodicalZugriff:
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In: IEEE Electron Device Letters, Jg. 27 (2006-04-01), S. 284-287Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 30 (2009-05-01), S. 541-543Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 29 (2008), S. 125-127Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 26 (2005-11-01), S. 836-838Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 26 (2005-09-01), S. 661-663Online unknownZugriff: