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Weniger Treffer
Art der Quelle
Thema
- components, circuits, devices and systems 87 Treffer
- mosfet 75 Treffer
- silicon 75 Treffer
- engineered materials, dielectrics and plasmas 64 Treffer
- logic gates 62 Treffer
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45 weitere Werte:
- mosfets 45 Treffer
- business 43 Treffer
- business.industry 43 Treffer
- materials science 43 Treffer
- optoelectronics 39 Treffer
- threshold voltage 39 Treffer
- computing and processing 38 Treffer
- silicon on insulator 38 Treffer
- metal oxide semiconductor field-effect transistors 28 Treffer
- communication, networking and broadcast technologies 22 Treffer
- electron mobility 21 Treffer
- mathematical model 21 Treffer
- germanium 20 Treffer
- signal processing and analysis 18 Treffer
- substrates 18 Treffer
- electrostatics 17 Treffer
- semiconductor device modeling 17 Treffer
- silicon on insulator technology 17 Treffer
- silicon-on-insulator technology 17 Treffer
- electrical engineering 16 Treffer
- electronic engineering 16 Treffer
- transistors 15 Treffer
- ultrathin body (utb) 15 Treffer
- chemistry 14 Treffer
- doping 14 Treffer
- mobility 14 Treffer
- photonics and electrooptics 14 Treffer
- effective mass 13 Treffer
- logic gate 13 Treffer
- surface roughness 13 Treffer
- electric potential 12 Treffer
- equations 12 Treffer
- finfets 12 Treffer
- mosfet circuits 12 Treffer
- capacitance 11 Treffer
- finfet 11 Treffer
- poisson equations 11 Treffer
- power, energy and industry applications 11 Treffer
- subthreshold slope 11 Treffer
- variability 11 Treffer
- chemistry.chemical_element 10 Treffer
- cmos 10 Treffer
- degradation 10 Treffer
- hardware_integratedcircuits 10 Treffer
- law 10 Treffer
Verlag
Publikation
- ieee transactions on electron devices 39 Treffer
- ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices 13 Treffer
- ieee transactions on nanotechnology 8 Treffer
- 2005 international semiconductor device research symposium 6 Treffer
- 2009 10th international conference on ultimate integration of silicon 5 Treffer
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45 weitere Werte:
- ieee journal of the electron devices society 4 Treffer
- 2005 ieee international soi conference proceedings 3 Treffer
- 2006 ieee international soi conferencee proceedings 3 Treffer
- 2007 international workshop on physics of semiconductor devices 3 Treffer
- 2008 ieee international conference on semiconductor electronics 3 Treffer
- 2008 symposium on vlsi technology 3 Treffer
- 2009 13th international workshop on computational electronics 3 Treffer
- 2012 international electron devices meeting 3 Treffer
- 2015 international symposium on vlsi technology, systems and applications 3 Treffer
- 71st device research conference 3 Treffer
- ieee access 3 Treffer
- 2005 ieee conference on electron devices and solid-state circuits 2 Treffer
- 2008 9th international conference on ultimate integration of silicon 2 Treffer
- 2008 ieee international conference on integrated circuit design and technology and tutorial 2 Treffer
- 2010 10th ieee international conference on solid-state and integrated circuit technology 2 Treffer
- 2011 ieee international conference on ic design & technology 2 Treffer
- 2011 international electron devices meeting 2 Treffer
- 2015 ieee 22nd international symposium on the physical and failure analysis of integrated circuits 2 Treffer
- 2017 symposium on vlsi technology 2 Treffer
- 2018 ieee symposium on vlsi technology 2 Treffer
- 68th device research conference 2 Treffer
- ieee international soi conference soi-02 2 Treffer
- proceedings of the 8th spanish conference on electron devices, cde'2011 2 Treffer
- proceedings. 7th international conference on solid-state and integrated circuits technology, 2004 2 Treffer
- ulis 2011 ultimate integration on silicon 2 Treffer
- 2002 ieee international soi conference (williamsburg va, 7-10 october 2002) 1 Treffer
- 2003 ieee conference on electron devices and solid-state circuits (ieee cat. no.03th8668 1 Treffer
- 2003 ieee international conference on robotics and automation (cat no 03ch37422) soi-03 1 Treffer
- 2006 ieee international soi conferencee proceedings ; issn 1078-621x 1 Treffer
- 2008 ieee international workshop on design and test of nano devices, circuits and systems 1 Treffer
- 2010 ieee international conference of electron devices and solid-state circuits (edssc 1 Treffer
- 2011 international semiconductor device research symposium (isdrs 1 Treffer
- 2012 13th international conference on ultimate integration on silicon (ulis 1 Treffer
- 2012 7th colombian computing congress (ccc 1 Treffer
- 2012 ieee international soi conference (soi 1 Treffer
- 2014 international conference on high performance computing and applications (ichpca 1 Treffer
- 2014 international workshop on computational electronics (iwce 1 Treffer
- 2014 silicon nanoelectronics workshop (snw 1 Treffer
- 2015 6th international conference on computers and devices for communication (codec 1 Treffer
- 2015 ieee international conference on electron devices and solid-state circuits (edssc 1 Treffer
- 2016 46th european solid-state device research conference (essderc 1 Treffer
- 2016 ieee computer society annual symposium on vlsi (isvlsi 1 Treffer
- 2017 4th international conference on advances in electrical engineering (icaee 1 Treffer
- 2017 international symposium on vlsi technology, systems and application (vlsi-tsa 1 Treffer
- 2018 33rd symposium on microelectronics technology and devices (sbmicro 1 Treffer
Sprache
Geographischer Bezug
Inhaltsanbieter
330 Treffer
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In: IEEE Transactions on Device and Materials Reliability, Jg. 24 (2024-06-01), Heft 2, S. 225-232academicJournalZugriff:
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In: 2022 International Semiconductor Conference (CAS), 2022-10-12, S. 247-250KonferenzZugriff:
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In: IEEE Transactions on Nanotechnology, Jg. 22 (2023), S. 8-13academicJournalZugriff:
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In: 2022 IEEE 22nd International Conference on Nanotechnology (NANO), 2022-07-04, S. 347-350KonferenzZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-09-01), Heft 9, S. 4828-4834academicJournalZugriff:
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In: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), 2021-09-01, S. 1-4KonferenzZugriff:
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In: 2021 Second International Conference on Electronics and Sustainable Communication Systems (ICESC), 2021-08-04, S. 522-529KonferenzZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-02-01), Heft 2, S. 497-502academicJournalZugriff:
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In: 2018 International Conference on Applied Electromagnetics, Signal Processing and Communication (AESPC), Jg. 1 (2018-10-01), S. 1-4KonferenzZugriff:
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In: 2018 33rd Symposium on Microelectronics Technology and Devices (SBMicro), 2018-08-01, S. 1-4KonferenzZugriff:
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In: 2018 Emerging Trends in Electronic Devices and Computational Techniques (EDCT), 2018-03-01, S. 1-5KonferenzZugriff:
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In: 2017 4th International Conference on Advances in Electrical Engineering (ICAEE), 2017-09-01, S. 59-63KonferenzZugriff:
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In: IEEE transactions on nanotechnology, Jg. 22 (2022), S. 8-13serialPeriodicalZugriff:
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In: 2016 46th European Solid-State Device Research Conference (ESSDERC), 2016-09-01, S. 416-419KonferenzZugriff:
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In: 2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2016-07-01, S. 467-472KonferenzZugriff:
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In: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM), 2018-03-01, S. 13-15KonferenzZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 65 (2018-03-01), Heft 3, S. 895-900academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-10-01), Heft 10, S. 3986-3990academicJournalZugriff:
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In: 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA), 2019-04-01, S. 1-2KonferenzZugriff:
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In: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2015-06-01, S. 111-114KonferenzZugriff: