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Weniger Treffer
Thema
- electronic, optical and magnetic materials 11 Treffer
- materials science 10 Treffer
- optoelectronics 10 Treffer
- silicon on insulator 9 Treffer
- mosfet 8 Treffer
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45 weitere Werte:
- electrical engineering 7 Treffer
- electronic engineering 5 Treffer
- threshold voltage 5 Treffer
- chemistry 4 Treffer
- chemistry.chemical_element 4 Treffer
- hardware_integratedcircuits 4 Treffer
- law 4 Treffer
- law.invention 4 Treffer
- logic gate 4 Treffer
- hardware_performanceandreliability 3 Treffer
- insulator (electricity) 3 Treffer
- leakage (electronics) 3 Treffer
- silicon 3 Treffer
- transistor 3 Treffer
- 01 natural sciences 2 Treffer
- 0103 physical sciences 2 Treffer
- 010302 applied physics 2 Treffer
- dopant 2 Treffer
- electron mobility 2 Treffer
- field-effect transistor 2 Treffer
- integrated circuit 2 Treffer
- nanoelectronics 2 Treffer
- scaling 2 Treffer
- schottky barrier 2 Treffer
- static random-access memory 2 Treffer
- voltage 2 Treffer
- 02 engineering and technology 1 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 1 Treffer
- 020206 networking & telecommunications 1 Treffer
- and gate 1 Treffer
- annealing (metallurgy) 1 Treffer
- ballistic conduction 1 Treffer
- biaxial tension 1 Treffer
- biotechnology 1 Treffer
- bsim 1 Treffer
- buried oxide 1 Treffer
- capacitance 1 Treffer
- chemistry.chemical_compound 1 Treffer
- cmos 1 Treffer
- computer science 1 Treffer
- computer science applications 1 Treffer
- condensed matter physics 1 Treffer
- contact resistance 1 Treffer
- depletion region 1 Treffer
- ekv mosfet model 1 Treffer
Publikation
Sprache
Inhaltsanbieter
13 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-10-01), S. 3986-3990Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 5 (2017-09-01), S. 335-339Online unknownZugriff:
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In: IEEE Transactions on Nanotechnology, Jg. 12 (2013-07-01), S. 524-531Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 60 (2013-04-01), S. 1485-1489Online unknownZugriff:
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In: IEEE Access, Jg. 1 (2013), S. 201-215Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012), S. 247-251Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 55 (2008-05-01), S. 1203-1210Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 54 (2007-05-01), S. 1125-1131Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 27 (2006-04-01), S. 284-287Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 52 (2005-04-01), S. 561-568Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 30 (2009-05-01), S. 541-543Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 29 (2008), S. 125-127Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 26 (2005-09-01), S. 661-663Online unknownZugriff: