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Publikation
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Inhaltsanbieter
41 Treffer
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In: IEEE Transactions on Nanotechnology, Jg. 22 (2023), S. 8-13Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-09-01), S. 4828-4834Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability ; page 1-1 ; ISSN 1530-4388 1558-2574, 2024Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices ; volume 68, issue 2, page 497-502 ; ISSN 0018-9383 1557-9646, 2021Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 65 (2018-03-01), S. 895-900Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-11-01), S. 4615-4621Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-10-01), S. 3986-3990Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 5 (2017-09-01), S. 335-339Online unknownZugriff:
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In: IEEE Transactions on Nanotechnology ; volume 22, page 8-13 ; ISSN 1536-125X 1941-0085, 2023Online academicJournalZugriff:
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In: IEEE Journal of the Electron Devices Society ; volume 5, issue 5, page 335-339 ; ISSN 2168-6734, 2017Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices ; volume 69, issue 9, page 4828-4834 ; ISSN 0018-9383 1557-9646, 2022Online academicJournalZugriff:
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In: IEEE Transactions on Nanotechnology, Jg. 12 (2013-07-01), S. 524-531Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 60 (2013-04-01), S. 1485-1489Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012), S. 247-251Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 58 (2011-03-01), S. 600-608Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 55 (2008-05-01), S. 1203-1210Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 54 (2007-05-01), S. 1125-1131Online unknownZugriff:
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In: IEEE Transactions On Nanotechnology, Jg. 6 (2007), S. 101-105Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 27 (2006-04-01), S. 284-287Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 52 (2005-11-01), S. 2430-2439Online unknownZugriff: