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- materials science 9 Treffer
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45 weitere Werte:
- logic gate 4 Treffer
- chemistry 3 Treffer
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- 01 natural sciences 2 Treffer
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- nanoelectronics 2 Treffer
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- silicon 2 Treffer
- 02 engineering and technology 1 Treffer
- 0202 electrical engineering, electronic engineering, information engineering 1 Treffer
- 020206 networking & telecommunications 1 Treffer
- and gate 1 Treffer
- annealing (metallurgy) 1 Treffer
- ballistic conduction 1 Treffer
- biaxial tension 1 Treffer
- biotechnology 1 Treffer
- buried oxide 1 Treffer
- capacitance 1 Treffer
- chemistry.chemical_compound 1 Treffer
- cmos 1 Treffer
- condensed matter physics 1 Treffer
- contact resistance 1 Treffer
- depletion region 1 Treffer
- ekv mosfet model 1 Treffer
- electric potential 1 Treffer
- electron 1 Treffer
- engineering 1 Treffer
- equivalent oxide thickness 1 Treffer
- extrinsic semiconductor 1 Treffer
- figure of merit 1 Treffer
- gate oxide 1 Treffer
- granularity 1 Treffer
- hardware_arithmeticandlogicstructures 1 Treffer
Publikation
Sprache
Inhaltsanbieter
11 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-10-01), S. 3986-3990Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 5 (2017-09-01), S. 335-339Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 60 (2013-04-01), S. 1485-1489Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012), S. 247-251Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 55 (2008-05-01), S. 1203-1210Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 54 (2007-05-01), S. 1125-1131Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 27 (2006-04-01), S. 284-287Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 52 (2005-04-01), S. 561-568Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 30 (2009-05-01), S. 541-543Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 29 (2008), S. 125-127Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 26 (2005-09-01), S. 661-663Online unknownZugriff: