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Weniger Treffer
Thema
- optoelectronics 47 Treffer
- materials science 46 Treffer
- silicon on insulator 38 Treffer
- electrical engineering 24 Treffer
- electrical and electronic engineering 17 Treffer
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45 weitere Werte:
- electronic, optical and magnetic materials 16 Treffer
- electronic engineering 14 Treffer
- chemistry 13 Treffer
- condensed matter physics 12 Treffer
- scaling 11 Treffer
- chemistry.chemical_element 10 Treffer
- threshold voltage 10 Treffer
- 01 natural sciences 9 Treffer
- 02 engineering and technology 9 Treffer
- electron mobility 9 Treffer
- 0103 physical sciences 8 Treffer
- 010302 applied physics 8 Treffer
- 0210 nano-technology 8 Treffer
- 021001 nanoscience & nanotechnology 8 Treffer
- capacitance 8 Treffer
- law 8 Treffer
- law.invention 8 Treffer
- materials chemistry 8 Treffer
- silicon 8 Treffer
- dopant 7 Treffer
- doping 7 Treffer
- chemistry.chemical_compound 6 Treffer
- communication channel 6 Treffer
- logic gate 6 Treffer
- transistor 6 Treffer
- cmos 5 Treffer
- engineering 5 Treffer
- gate oxide 5 Treffer
- hardware_integratedcircuits 5 Treffer
- hardware_performanceandreliability 5 Treffer
- high-κ dielectric 5 Treffer
- nanoscopic scale 5 Treffer
- schottky barrier 5 Treffer
- subthreshold slope 5 Treffer
- condensed matter::mesoscopic systems and quantum hall effect 4 Treffer
- equivalent series resistance 4 Treffer
- gate dielectric 4 Treffer
- insulator (electricity) 4 Treffer
- metal gate 4 Treffer
- nanotechnology 4 Treffer
- node (circuits) 4 Treffer
- poisson's equation 4 Treffer
- transconductance 4 Treffer
- ultra thin body 4 Treffer
- computational physics 3 Treffer
Verlag
Publikation
- ieee transactions on electron devices 5 Treffer
- solid-state electronics 5 Treffer
- ieee electron device letters 3 Treffer
- proceedings. 7th international conference on solid-state and integrated circuits technology, 2004. 2 Treffer
- semiconductor science and technology 2 Treffer
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30 weitere Werte:
- 2003 ieee conference on electron devices and solid-state circuits (ieee cat. no.03th8668) 1 Treffer
- 2005 ieee conference on electron devices and solid-state circuits 1 Treffer
- 2005 ieee international soi conference proceedings 1 Treffer
- 2006 ieee international soi conferencee proceedings 1 Treffer
- 2007 international workshop on physics of semiconductor devices 1 Treffer
- 2008 ieee international conference on semiconductor electronics 1 Treffer
- 2009 10th international conference on ultimate integration of silicon 1 Treffer
- 2010 10th ieee international conference on solid-state and integrated circuit technology 1 Treffer
- 2010 ieee international conference of electron devices and solid-state circuits (edssc) 1 Treffer
- 2012 13th international conference on ultimate integration on silicon (ulis) 1 Treffer
- 2012 international electron devices meeting 1 Treffer
- 2014 international conference on high performance computing and applications (ichpca) 1 Treffer
- 2015 ieee 22nd international symposium on the physical and failure analysis of integrated circuits 1 Treffer
- 2015 ieee international conference on electron devices and solid-state circuits (edssc) 1 Treffer
- 2017 symposium on vlsi technology 1 Treffer
- 2018 ieee 2nd electron devices technology and manufacturing conference (edtm) 1 Treffer
- 2018 ieee symposium on vlsi technology 1 Treffer
- 2018 international symposium on vlsi technology, systems and application (vlsi-tsa) 1 Treffer
- 68th device research conference 1 Treffer
- 71st device research conference 1 Treffer
- 7th international symposium on quality electronic design (isqed'06) 1 Treffer
- acta physica sinica 1 Treffer
- ecs transactions 1 Treffer
- extended abstracts of the 2002 international conference on solid state devices and materials 1 Treffer
- extended abstracts of the 2010 international conference on solid state devices and materials 1 Treffer
- facta universitatis - series: electronics and energetics 1 Treffer
- international conference on simulation of semiconductor processes and devices, 2003. sispad 2003. 1 Treffer
- materials science in semiconductor processing 1 Treffer
- superlattices and microstructures 1 Treffer
- ulis 2011 ultimate integration on silicon 1 Treffer
Sprache
Inhaltsanbieter
55 Treffer
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In: Materials Science in Semiconductor Processing, Jg. 96 (2019-06-01), S. 41-45Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-10-01), S. 3986-3990Online unknownZugriff:
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In: Facta universitatis - series: Electronics and Energetics, Jg. 30 (2017), S. 375-382Online unknownZugriff:
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In: Superlattices and Microstructures, Jg. 101 (2017), S. 362-372Online unknownZugriff:
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In: 2018 IEEE Symposium on VLSI Technology, 2018-06-01Online unknownZugriff:
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In: 2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA), 2018-04-01Online unknownZugriff:
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In: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM), 2018-03-01Online unknownZugriff:
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In: 2017 Symposium on VLSI Technology, 2017-06-01Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 60 (2013-04-01), S. 1485-1489Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012), S. 247-251Online unknownZugriff:
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In: Solid-State Electronics, Jg. 54 (2010-05-01), S. 545-551Online unknownZugriff:
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In: Solid-State Electronics, Jg. 53 (2009-05-01), S. 540-547Online unknownZugriff:
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In: ECS Transactions, Jg. 18 (2009-03-06), S. 77-81Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 54 (2007-05-01), S. 1125-1131Online unknownZugriff:
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In: Semiconductor Science and Technology, Jg. 22 (2007-04-23), S. 577-583Online unknownZugriff:
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In: 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), 2015-06-01Online unknownZugriff:
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In: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2015-06-01Online unknownZugriff:
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In: 2015 International Symposium on VLSI Technology, Systems and Applications, 2015-04-01Online unknownZugriff:
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In: Solid-State Electronics, Jg. 50 (2006-04-01), S. 660-667Online unknownZugriff:
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In: Solid-State Electronics, Jg. 50 (2006), S. 86-93Online unknownZugriff: