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Weniger Treffer
Thema
- electrical engineering 4 Treffer
- parasitic capacitance 3 Treffer
- chemistry 2 Treffer
- chemistry.chemical_element 2 Treffer
- electrical and electronic engineering 2 Treffer
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- electronic engineering 1 Treffer
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- hardware_performanceandreliability 1 Treffer
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- scalability 1 Treffer
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- transit time 1 Treffer
- ultra thin body 1 Treffer
- work function 1 Treffer
Verlag
Publikation
- 2003 ieee conference on electron devices and solid-state circuits (ieee cat. no.03th8668) 1 Treffer
- 2010 10th ieee international conference on solid-state and integrated circuit technology 1 Treffer
- 2018 ieee 2nd electron devices technology and manufacturing conference (edtm) 1 Treffer
- ieee transactions on electron devices 1 Treffer
- proceedings. 7th international conference on solid-state and integrated circuits technology, 2004. 1 Treffer
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Inhaltsanbieter
7 Treffer
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In: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM), 2018-03-01Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 52 (2005-04-01), S. 561-568Online unknownZugriff:
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In: Solid-State Electronics, Jg. 49 (2005-03-01), S. 479-483Online unknownZugriff:
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In: 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, 2010-11-01Online unknownZugriff:
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In: Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology,, 2005-06-07Online unknownZugriff:
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In: 2003 IEEE Conference on Electron Devices and Solid-State Circuits (IEEE Cat. No.03TH8668), 2003Online unknownZugriff: