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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-02-01), Heft 2, S. 497-502academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-02-01), Heft 2, S. 497-502Online unknownZugriff:
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In: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM), 2018-03-01Online unknownZugriff:
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In: Solid-State Electronics, Jg. 52 (2008-12-01), S. 1867-1871Online unknownZugriff:
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In: Solid-State Electronics, Jg. 50 (2006), S. 86-93Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 52 (2005-04-01), S. 561-568Online unknownZugriff:
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In: Solid-State Electronics, Jg. 49 (2005-03-01), S. 479-483Online unknownZugriff:
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In: Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology,, 2005-06-07Online unknownZugriff:
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In: 2003 IEEE Conference on Electron Devices and Solid-State Circuits (IEEE Cat. No.03TH8668), 2003Online unknownZugriff: