Suchergebnisse
LBZ-Katalog
Aufsätze und mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Thema
- forma onda 9 Treffer
- forme onde 9 Treffer
- waveform 9 Treffer
- optical properties 6 Treffer
- propiedad optica 6 Treffer
-
45 weitere Werte:
- propriete optique 6 Treffer
- defect formation 5 Treffer
- formacion defecto 5 Treffer
- formation defaut 5 Treffer
- ataque quimico 4 Treffer
- attaque chimique 4 Treffer
- capa epitaxica 4 Treffer
- chemical etching 4 Treffer
- couche epitaxique 4 Treffer
- epitaxial film 4 Treffer
- cadmium tellurides 3 Treffer
- cadmium tellurure 3 Treffer
- cd te 3 Treffer
- crystalline material 3 Treffer
- defect density 3 Treffer
- densidad defecto 3 Treffer
- densite defaut 3 Treffer
- fotoluminiscencia 3 Treffer
- galio arseniuro 3 Treffer
- gallium arsenides 3 Treffer
- gallium arseniure 3 Treffer
- material cristalino 3 Treffer
- materiau cristallin 3 Treffer
- modificacion estructural 3 Treffer
- modification structure 3 Treffer
- photoluminescence 3 Treffer
- structure modification 3 Treffer
- absorption spectrum 2 Treffer
- analisis estructural 2 Treffer
- analyse structurale 2 Treffer
- as ga 2 Treffer
- banda prohibida 2 Treffer
- bande interdite 2 Treffer
- cadmio compuesto 2 Treffer
- cadmio telururo 2 Treffer
- cadmium compose 2 Treffer
- cadmium compound 2 Treffer
- cdte 2 Treffer
- complex defect 2 Treffer
- condensacion haz molecular 2 Treffer
- condensation faisceau moleculaire 2 Treffer
- cristalizacion 2 Treffer
- cristallisation 2 Treffer
- crystallization 2 Treffer
- defaut complexe 2 Treffer
Publikation
Sprache
Inhaltsanbieter
11 Treffer
-
In: VLSI circuits and systems (Maspalomas, 19-21 May 2003), 2003, S. 538-546KonferenzZugriff:
-
In: Material science and material properties for infrared optoelectronics (Kiev, 29 September - 2 October 1998), 1999, S. 475-478KonferenzZugriff:
-
In: Material science and material properties for infrared optoelectronics (Kiev, 29 September - 2 October 1998), 1999, S. 454-457KonferenzZugriff:
-
In: Material science and material properties for infrared optoelectronics (Kiev, 29 September - 2 October 1998), 1999, S. 559-563KonferenzZugriff:
-
In: Material science and material properties for infrared optoelectronics (Kiev, 29 September - 2 October 1998), 1999, S. 548-554KonferenzZugriff:
-
In: Material science and material properties for infrared optoelectronics (Kiev, 29 September - 2 October 1998), 1999, S. 357-362KonferenzZugriff:
-
In: Material science and material properties for infrared optoelectronics (Kiev, 29 September - 2 October 1998), 1999, S. 82-86KonferenzZugriff:
-
In: Material science and material properties for infrared optoelectronics (Kiev, 29 September - 2 October 1998), 1999, S. 537-541KonferenzZugriff:
-
In: Material science and material properties for infrared optoelectronics (Kiev, 29 September - 2 October 1998), 1999, S. 170-176KonferenzZugriff:
-
In: Material science and material properties for infrared optoelectronics (Kiev, 29 September - 2 October 1998), 1999, S. 464-468KonferenzZugriff:
-
In: Material science and material properties for infrared optoelectronics (Kiev, 29 September - 2 October 1998), 1999, S. 483-486KonferenzZugriff: