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Weniger Treffer
Thema
- mosfet 9 Treffer
- silicon on insulator 6 Treffer
- chemistry 4 Treffer
- chemistry.chemical_element 4 Treffer
- electronic engineering 4 Treffer
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45 weitere Werte:
- silicon 4 Treffer
- 01 natural sciences 3 Treffer
- 02 engineering and technology 3 Treffer
- 0210 nano-technology 3 Treffer
- 021001 nanoscience & nanotechnology 3 Treffer
- electron 3 Treffer
- monte carlo method 3 Treffer
- 0103 physical sciences 2 Treffer
- 010302 applied physics 2 Treffer
- chemistry.chemical_compound 2 Treffer
- effective mass (solid-state physics) 2 Treffer
- electrical and electronic engineering 2 Treffer
- electronic band structure 2 Treffer
- electronic, optical and magnetic materials 2 Treffer
- full band 2 Treffer
- induced high electron mobility transistor 2 Treffer
- passivation 2 Treffer
- scaling 2 Treffer
- silicon-germanium 2 Treffer
- surface roughness 2 Treffer
- 0104 chemical sciences 1 Treffer
- 010402 general chemistry 1 Treffer
- ballistic conduction 1 Treffer
- biaxial tension 1 Treffer
- buried oxide 1 Treffer
- capacitance 1 Treffer
- carrier scattering 1 Treffer
- cmos 1 Treffer
- communication channel 1 Treffer
- computational physics 1 Treffer
- condensed matter physics 1 Treffer
- coulomb scattering 1 Treffer
- density gradient 1 Treffer
- ekv mosfet model 1 Treffer
- electric potential 1 Treffer
- electrical engineering 1 Treffer
- electronic circuit 1 Treffer
- etching (microfabrication) 1 Treffer
- field (physics) 1 Treffer
- field-effect transistor 1 Treffer
- high-κ dielectric 1 Treffer
- insulator (electricity) 1 Treffer
- international electron devices meeting 1 Treffer
- lift (force) 1 Treffer
- logic gate 1 Treffer
Verlag
Publikation
- 2010 10th ieee international conference on solid-state and integrated circuit technology 1 Treffer
- 2017 symposium on vlsi technology 1 Treffer
- 2018 ieee symposium on vlsi technology 1 Treffer
- 2018 international symposium on vlsi technology, systems and application (vlsi-tsa) 1 Treffer
- 2019 international symposium on vlsi technology, systems and application (vlsi-tsa) 1 Treffer
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6 weitere Werte:
- ecs meeting abstracts 1 Treffer
- ieee electron device letters 1 Treffer
- ieee transactions on electron devices 1 Treffer
- international conference on simulation of semiconductor processes and devices, 2003. sispad 2003. 1 Treffer
- journal of the korean institute of electrical and electronic material engineers 1 Treffer
- proceedings. 7th international conference on solid-state and integrated circuits technology, 2004. 1 Treffer
Sprache
Inhaltsanbieter
12 Treffer
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In: 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA), 2019-04-01Online unknownZugriff:
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In: 2018 IEEE Symposium on VLSI Technology, 2018-06-01Online unknownZugriff:
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In: 2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA), 2018-04-01Online unknownZugriff:
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In: 2017 Symposium on VLSI Technology, 2017-06-01Online unknownZugriff:
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In: Journal of the Korean Institute of Electrical and Electronic Material Engineers, Jg. 20 (2007-11-01), S. 939-942Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 54 (2007-05-01), S. 1125-1131Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 26 (2005-09-01), S. 661-663Online unknownZugriff:
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In: 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, 2010-11-01Online unknownZugriff:
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In: 2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems, 2008-09-01Online unknownZugriff:
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In: Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology,, 2005-06-07Online unknownZugriff:
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In: International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD, 2003Online unknownZugriff:
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In: ECS Meeting Abstracts, 2006-06-30, S. 1397-1397Online unknownZugriff: