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74 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-09-01), S. 4828-4834Online unknownZugriff:
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In: IEEE Transactions on Device and Materials Reliability ; page 1-1 ; ISSN 1530-4388 1558-2574, 2024Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 68 (2021-02-01), Heft 2, S. 497-502Online unknownZugriff:
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In: IEEE Transactions on Electron Devices ; volume 68, issue 2, page 497-502 ; ISSN 0018-9383 1557-9646, 2021Online academicJournalZugriff:
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In: Microsystem Technologies, Jg. 28 (2018-09-22), S. 653-658Online unknownZugriff:
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In: Semiconductor Science and Technology, Jg. 36 (2021-10-08), S. 115009-115009Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 65 (2018-03-01), S. 895-900Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-11-01), S. 4615-4621Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-10-01), S. 3986-3990Online unknownZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 5 (2017-09-01), S. 335-339Online unknownZugriff:
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In: IEEE Transactions on Electron Devices ; volume 69, issue 9, page 4828-4834 ; ISSN 0018-9383 1557-9646, 2022Online academicJournalZugriff:
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In: IEEE Journal of the Electron Devices Society ; volume 5, issue 5, page 335-339 ; ISSN 2168-6734, 2017Online academicJournalZugriff:
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In: Solid-State Electronics, Jg. 95 (2014-05-01), S. 52-60Online unknownZugriff:
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In: Solid-State Electronics, Jg. 91 (2014), S. 28-35Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 60 (2013-04-01), S. 1485-1489Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012), S. 247-251Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 58 (2011-03-01), S. 600-608Online unknownZugriff:
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In: Solid-State Electronics, Jg. 54 (2010-05-01), S. 545-551Online unknownZugriff:
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In: Solid-State Electronics, Jg. 54 (2010-02-01), S. 143-148Online unknownZugriff:
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In: Solid-State Electronics, Jg. 53 (2009-05-01), S. 540-547Online unknownZugriff: