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Thema
- particle scattering 2 Treffer
- acoustic devices 1 Treffer
- charge carrier processes 1 Treffer
- cmos technology 1 Treffer
- computing and processing 1 Treffer
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19 weitere Werte:
- doping 1 Treffer
- effective mass 1 Treffer
- electromagnetic compatibility 1 Treffer
- electrostatics 1 Treffer
- gradient methods 1 Treffer
- impurities 1 Treffer
- microelectronics 1 Treffer
- monte carlo methods 1 Treffer
- mosfet circuits 1 Treffer
- optical scattering 1 Treffer
- permittivity 1 Treffer
- phonons 1 Treffer
- poisson equations 1 Treffer
- potential well 1 Treffer
- predictive models 1 Treffer
- silicon 1 Treffer
- silicon on insulator technology 1 Treffer
- surface fitting 1 Treffer
- tensile stress 1 Treffer
Publikation
- 2006 ieee international soi conferencee proceedings, international soi conference, 2006 ieee 1 Treffer
- international conference on simulation of semiconductor processes and devices, 2003. sispad 2003., simulation of semiconductor processes and devices, 2003. sispad 2003. international conference on, simulation of semiconductor processes and devices 1 Treffer
- proceedings. 7th international conference on solid-state and integrated circuits technology, 2004., solid-state and integrated circuits technology, 2004. proceedings. 7th international conference on, solid-state and integrated circuits technology 1 Treffer
Inhaltsanbieter
3 Treffer
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In: Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology,, Jg. 2 (2004), S. 995-998KonferenzZugriff:
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In: International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD, 2003, S. 51-54KonferenzZugriff:
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In: 2006 IEEE international SOI Conferencee Proceedings, International SOI Conference, 2006-10-01, S. 79KonferenzZugriff: