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Weniger Treffer
Art der Quelle
Thema
- computing and processing 5 Treffer
- engineered materials, dielectrics and plasmas 5 Treffer
- resource description framework 5 Treffer
- communication, networking and broadcast technologies 4 Treffer
- random access memory 4 Treffer
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45 weitere Werte:
- threshold voltage 4 Treffer
- doping 3 Treffer
- semiconductor process modeling 3 Treffer
- signal processing and analysis 3 Treffer
- stability 3 Treffer
- circuit simulation 2 Treffer
- logic gates 2 Treffer
- metals 2 Treffer
- mosfets 2 Treffer
- robotics and control systems 2 Treffer
- transistors 2 Treffer
- bioengineering 1 Treffer
- circuit noise 1 Treffer
- circuit stability 1 Treffer
- cmos technology 1 Treffer
- correlation 1 Treffer
- electric potential 1 Treffer
- electron devices 1 Treffer
- electrostatics 1 Treffer
- etching 1 Treffer
- fields, waves and electromagnetics 1 Treffer
- fully depleted silicon-on-insulator (soi) 1 Treffer
- immune system 1 Treffer
- impurities 1 Treffer
- integrated circuit modeling 1 Treffer
- leakage 1 Treffer
- libraries 1 Treffer
- mosfet 1 Treffer
- nanoscale devices 1 Treffer
- performance 1 Treffer
- photonics and electrooptics 1 Treffer
- power, energy and industry applications 1 Treffer
- random dopant fluctuation (rdf) 1 Treffer
- random dopant fluctuations (rdfs) 1 Treffer
- robustness 1 Treffer
- scattering 1 Treffer
- semiconductor device modeling 1 Treffer
- shape 1 Treffer
- silicon 1 Treffer
- silicon germanium 1 Treffer
- silicon on insulator technology 1 Treffer
- sram chips 1 Treffer
- static noise margin 1 Treffer
- static random access memory (sram) 1 Treffer
- substrates 1 Treffer
Publikation
- 2005 ieee international soi conference proceedings, soi conference, 2005. proceedings. 2005 ieee international, soi conference 1 Treffer
- 2010 ieee international conference of electron devices and solid-state circuits (edssc), electron devices and solid-state circuits (edssc), 2010 ieee international conference of 1 Treffer
- 2011 ieee international conference on ic design & technology, ic design & technology (icicdt), 2011 ieee international conference on 1 Treffer
- 2012 ieee international soi conference (soi), soi conference (soi), 2012 ieee international 1 Treffer
- 2018 international symposium on vlsi technology, systems and application (vlsi-tsa), vlsi technology, systems and application (vlsi-tsa), 2018 international symposium on 1 Treffer
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3 weitere Werte:
- ieee 2011 international soi conference, soi conference (soi), 2011 ieee international 1 Treffer
- ieee electron device letters, electron device letters, ieee, ieee electron device lett. 1 Treffer
- proceedings of 35th european solid-state device research conference, 2005. essderc 2005., solid-state device research conference, 2005. essderc 2005. proceedings of 35th european, solid-state device research conference 1 Treffer
Inhaltsanbieter
8 Treffer
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In: 2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA), 2018-04-01, S. 1-2KonferenzZugriff:
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In: 2011 IEEE International Conference on IC Design & Technology, 2011-05-01, S. 1-4KonferenzZugriff:
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In: 2010 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC), 2010-12-01, S. 1-4KonferenzZugriff:
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In: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC, 2005, S. 553-556KonferenzZugriff:
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In: IEEE Electron Device Letters, Jg. 27 (2006-04-01), Heft 4, S. 284-287academicJournalZugriff:
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In: 2012 IEEE International SOI Conference (SOI), 2012-10-01, S. 1-2KonferenzZugriff:
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In: IEEE 2011 International SOI Conference, 2011-10-01, S. 1-2KonferenzZugriff:
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In: 2005 IEEE International SOI Conference Proceedings, 2005, S. 61-62KonferenzZugriff: