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Thema
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- depletion-mode field-effect transistor (fet) 1 Treffer
- dopant segregation 1 Treffer
- doping 1 Treffer
- double gate 1 Treffer
- drain-induced barrier lowering (dibl) 1 Treffer
- drift diffusion (dd) 1 Treffer
- electrostatics 1 Treffer
- fd soi 1 Treffer
- fields, waves and electromagnetics 1 Treffer
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- schottky barriers 1 Treffer
- semiconductor process modeling 1 Treffer
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- signal processing and analysis 1 Treffer
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- silicon-on-insulator (soi) 1 Treffer
- soi 1 Treffer
- solid modeling 1 Treffer
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- variability 1 Treffer
Publikation
- ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices 3 Treffer
- 2017 4th international conference on advances in electrical engineering (icaee), advances in electrical engineering (icaee), 2017 4th international conference on 1 Treffer
- ieee journal of the electron devices society, electron devices society, ieee journal of the, ieee j. electron devices soc. 1 Treffer
- proceedings of the 19th international conference mixed design of integrated circuits and systems - mixdes 2012, mixed design of integrated circuits and systems (mixdes), 2012 proceedings of the 19th international conference 1 Treffer
- proceedings of the 8th spanish conference on electron devices, cde'2011, electron devices (cde), 2011 spanish conference on 1 Treffer
Inhaltsanbieter
7 Treffer
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In: 2017 4th International Conference on Advances in Electrical Engineering (ICAEE), 2017-09-01, S. 59-63KonferenzZugriff:
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In: Proceedings of the 19th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2012, 2012-05-01, S. 88-93KonferenzZugriff:
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In: Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011, 2011-02-01, S. 1-4KonferenzZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012-04-01), Heft 4, S. 941-948academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012), Heft 1, S. 247-251academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 58 (2011-03-01), Heft 3, S. 600-608academicJournalZugriff:
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In: IEEE Journal of the Electron Devices Society, Jg. 5 (2017-09-01), Heft 5, S. 335-335academicJournalZugriff: