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Weniger Treffer
Art der Quelle
Thema
- logic gates 9 Treffer
- silicon 6 Treffer
- computing and processing 4 Treffer
- power, energy and industry applications 4 Treffer
- substrates 4 Treffer
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45 weitere Werte:
- mosfets 3 Treffer
- performance evaluation 3 Treffer
- scattering 3 Treffer
- ultrathin body (utb) 3 Treffer
- cmos integrated circuits 2 Treffer
- engineering profession 2 Treffer
- etching 2 Treffer
- germanium 2 Treffer
- metals 2 Treffer
- mosfet circuits 2 Treffer
- photonics and electrooptics 2 Treffer
- semiconductor device modeling 2 Treffer
- silicon-on-insulator (soi) 2 Treffer
- tunneling 2 Treffer
- annealing 1 Treffer
- back gate 1 Treffer
- bioengineering 1 Treffer
- capacitance 1 Treffer
- communication, networking and broadcast technologies 1 Treffer
- crystals 1 Treffer
- data models 1 Treffer
- degradation 1 Treffer
- delays 1 Treffer
- double gate 1 Treffer
- drift diffusion (dd) 1 Treffer
- effective mass 1 Treffer
- electron mobility 1 Treffer
- equations 1 Treffer
- fluctuations 1 Treffer
- gate leakage 1 Treffer
- ge-on-insulator (geoi) 1 Treffer
- germanium-on-insulator (goi) 1 Treffer
- gidl 1 Treffer
- indium gallium arsenide 1 Treffer
- ion implantation 1 Treffer
- junctions 1 Treffer
- leakage currents 1 Treffer
- mathematical model 1 Treffer
- metal-oxide-semiconductor field-effect transistors (mosfets) 1 Treffer
- mobility 1 Treffer
- modeling 1 Treffer
- modulation 1 Treffer
- monte carlo (mc) 1 Treffer
- parasitic capacitance 1 Treffer
- passivation 1 Treffer
Publikation
- ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices 6 Treffer
- 2014 silicon nanoelectronics workshop (snw), silicon nanoelectronics workshop (snw), 2014 ieee 1 Treffer
- 2015 ieee 22nd international symposium on the physical and failure analysis of integrated circuits, physical and failure analysis of integrated circuits (ipfa), 2015 ieee 22nd international symposium on the 1 Treffer
- 2017 international symposium on vlsi technology, systems and application (vlsi-tsa), vlsi technology, systems and application (vlsi-tsa), 2017 international symposium on 1 Treffer
- 2018 ieee 2nd electron devices technology and manufacturing conference (edtm), electron devices technology and manufacturing conference (edtm), 2018 ieee 2nd 1 Treffer
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3 weitere Werte:
- 2018 international symposium on vlsi technology, systems and application (vlsi-tsa), vlsi technology, systems and application (vlsi-tsa), 2018 international symposium on 1 Treffer
- 2019 international symposium on vlsi technology, systems and application (vlsi-tsa), vlsi technology, systems and application (vlsi-tsa), 2019 international symposium on 1 Treffer
- 71st device research conference, device research conference (drc), 2013 71st annual 1 Treffer
Inhaltsanbieter
13 Treffer
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In: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM), 2018-03-01, S. 13-15KonferenzZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 65 (2018-03-01), Heft 3, S. 895-900academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-10-01), Heft 10, S. 3986-3990academicJournalZugriff:
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In: 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA), 2019-04-01, S. 1-2KonferenzZugriff:
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In: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2015-06-01, S. 111-114KonferenzZugriff:
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In: 2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA), 2018-04-01, S. 1-2KonferenzZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-11-01), Heft 11, S. 4615academicJournalZugriff:
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In: 2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA), 2017-04-01, S. 1-2KonferenzZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 58 (2011-03-01), Heft 3, S. 600-608academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 55 (2008-05-01), Heft 5, S. 1203-1210academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 52 (2005-04-01), Heft 4, S. 561-568academicJournalZugriff:
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In: 2014 Silicon Nanoelectronics Workshop (SNW), 2014-06-01, S. 1-2KonferenzZugriff:
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In: 71st Device Research Conference, 2013-06-01, S. 61-62KonferenzZugriff: