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Weniger Treffer
Thema
- optoelectronics 5 Treffer
- electrical engineering 4 Treffer
- silicon on insulator 4 Treffer
- doping 3 Treffer
- nanotechnology 2 Treffer
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30 weitere Werte:
- threshold voltage 2 Treffer
- beyond cmos 1 Treffer
- boundary value problem 1 Treffer
- buried oxide 1 Treffer
- communication channel 1 Treffer
- computational mathematics 1 Treffer
- condensed matter physics 1 Treffer
- distribution (number theory) 1 Treffer
- dopant 1 Treffer
- double gate 1 Treffer
- electric potential 1 Treffer
- electrical and electronic engineering 1 Treffer
- electronic circuit 1 Treffer
- electronic engineering 1 Treffer
- engineering physics 1 Treffer
- general chemistry 1 Treffer
- general earth and planetary sciences 1 Treffer
- general environmental science 1 Treffer
- general materials science 1 Treffer
- impurity 1 Treffer
- insulator (electricity) 1 Treffer
- mixed mode 1 Treffer
- nanoelectronics 1 Treffer
- poisson's equation 1 Treffer
- scaling 1 Treffer
- semiconductor industry 1 Treffer
- sram cell 1 Treffer
- switching time 1 Treffer
- ultra thin body 1 Treffer
- variation (linguistics) 1 Treffer
Verlag
Publikation
- 2007 international workshop on physics of semiconductor devices 1 Treffer
- 2010 ieee international conference of electron devices and solid-state circuits (edssc) 1 Treffer
- ecs transactions 1 Treffer
- extended abstracts of the 2010 international conference on solid state devices and materials 1 Treffer
- facta universitatis - series: electronics and energetics 1 Treffer
Sprache
Inhaltsanbieter
7 Treffer
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In: Facta universitatis - series: Electronics and Energetics, Jg. 30 (2017), S. 375-382Online unknownZugriff:
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In: ECS Transactions, Jg. 18 (2009-03-06), S. 77-81Online unknownZugriff:
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In: 2010 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC), 2010-12-01Online unknownZugriff:
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In: Extended Abstracts of the 2010 International Conference on Solid State Devices and Materials, 2010-09-23Online unknownZugriff:
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In: 2007 International Workshop on Physics of Semiconductor Devices, 2007-12-01Online unknownZugriff: