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Weniger Treffer
Thema
- silicon on insulator 32 Treffer
- electrical engineering 18 Treffer
- electrical and electronic engineering 12 Treffer
- chemistry 11 Treffer
- electronic engineering 11 Treffer
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45 weitere Werte:
- electronic, optical and magnetic materials 11 Treffer
- scaling 10 Treffer
- 01 natural sciences 9 Treffer
- 02 engineering and technology 9 Treffer
- chemistry.chemical_element 9 Treffer
- threshold voltage 9 Treffer
- 0103 physical sciences 8 Treffer
- 010302 applied physics 8 Treffer
- 0210 nano-technology 8 Treffer
- 021001 nanoscience & nanotechnology 8 Treffer
- electron mobility 8 Treffer
- capacitance 7 Treffer
- dopant 7 Treffer
- doping 7 Treffer
- silicon 7 Treffer
- condensed matter physics 6 Treffer
- law 6 Treffer
- law.invention 6 Treffer
- transistor 6 Treffer
- chemistry.chemical_compound 5 Treffer
- cmos 5 Treffer
- communication channel 5 Treffer
- gate oxide 5 Treffer
- high-κ dielectric 5 Treffer
- logic gate 5 Treffer
- nanoscopic scale 5 Treffer
- schottky barrier 5 Treffer
- equivalent series resistance 4 Treffer
- gate dielectric 4 Treffer
- insulator (electricity) 4 Treffer
- materials chemistry 4 Treffer
- metal gate 4 Treffer
- nanotechnology 4 Treffer
- subthreshold slope 4 Treffer
- ultra thin body 4 Treffer
- condensed matter::mesoscopic systems and quantum hall effect 3 Treffer
- contact resistance 3 Treffer
- dielectric 3 Treffer
- field-effect transistor 3 Treffer
- hardware_integratedcircuits 3 Treffer
- hardware_performanceandreliability 3 Treffer
- parasitic capacitance 3 Treffer
- short-channel effect 3 Treffer
- transconductance 3 Treffer
- and gate 2 Treffer
Verlag
Publikation
- ieee transactions on electron devices 4 Treffer
- ieee electron device letters 3 Treffer
- proceedings. 7th international conference on solid-state and integrated circuits technology, 2004. 2 Treffer
- semiconductor science and technology 2 Treffer
- 2003 ieee conference on electron devices and solid-state circuits (ieee cat. no.03th8668) 1 Treffer
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28 weitere Werte:
- 2005 ieee conference on electron devices and solid-state circuits 1 Treffer
- 2005 ieee international soi conference proceedings 1 Treffer
- 2006 ieee international soi conferencee proceedings 1 Treffer
- 2007 international workshop on physics of semiconductor devices 1 Treffer
- 2009 10th international conference on ultimate integration of silicon 1 Treffer
- 2010 10th ieee international conference on solid-state and integrated circuit technology 1 Treffer
- 2010 ieee international conference of electron devices and solid-state circuits (edssc) 1 Treffer
- 2012 13th international conference on ultimate integration on silicon (ulis) 1 Treffer
- 2012 international electron devices meeting 1 Treffer
- 2014 international conference on high performance computing and applications (ichpca) 1 Treffer
- 2015 ieee international conference on electron devices and solid-state circuits (edssc) 1 Treffer
- 2017 symposium on vlsi technology 1 Treffer
- 2018 ieee 2nd electron devices technology and manufacturing conference (edtm) 1 Treffer
- 2018 ieee symposium on vlsi technology 1 Treffer
- 2018 international symposium on vlsi technology, systems and application (vlsi-tsa) 1 Treffer
- 68th device research conference 1 Treffer
- 71st device research conference 1 Treffer
- 7th international symposium on quality electronic design (isqed'06) 1 Treffer
- acta physica sinica 1 Treffer
- ecs transactions 1 Treffer
- extended abstracts of the 2002 international conference on solid state devices and materials 1 Treffer
- extended abstracts of the 2010 international conference on solid state devices and materials 1 Treffer
- facta universitatis - series: electronics and energetics 1 Treffer
- international conference on simulation of semiconductor processes and devices, 2003. sispad 2003. 1 Treffer
- materials science in semiconductor processing 1 Treffer
- solid-state electronics 1 Treffer
- superlattices and microstructures 1 Treffer
- ulis 2011 ultimate integration on silicon 1 Treffer
Sprache
Inhaltsanbieter
47 Treffer
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In: Materials Science in Semiconductor Processing, Jg. 96 (2019-06-01), S. 41-45Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 64 (2017-10-01), S. 3986-3990Online unknownZugriff:
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In: Facta universitatis - series: Electronics and Energetics, Jg. 30 (2017), S. 375-382Online unknownZugriff:
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In: Superlattices and Microstructures, Jg. 101 (2017), S. 362-372Online unknownZugriff:
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In: 2018 IEEE Symposium on VLSI Technology, 2018-06-01Online unknownZugriff:
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In: 2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA), 2018-04-01Online unknownZugriff:
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In: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM), 2018-03-01Online unknownZugriff:
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In: 2017 Symposium on VLSI Technology, 2017-06-01Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 60 (2013-04-01), S. 1485-1489Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012), S. 247-251Online unknownZugriff:
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In: ECS Transactions, Jg. 18 (2009-03-06), S. 77-81Online unknownZugriff:
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In: Semiconductor Science and Technology, Jg. 22 (2007-04-23), S. 577-583Online unknownZugriff:
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In: 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), 2015-06-01Online unknownZugriff:
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In: 2015 International Symposium on VLSI Technology, Systems and Applications, 2015-04-01Online unknownZugriff:
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In: 2014 International Conference on High Performance Computing and Applications (ICHPCA), 2014-12-01Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 52 (2005-04-01), S. 561-568Online unknownZugriff:
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In: Solid-State Electronics, Jg. 49 (2005-03-01), S. 479-483Online unknownZugriff:
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2013Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 30 (2009-05-01), S. 541-543Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 29 (2008), S. 125-127Online unknownZugriff: