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Weniger Treffer
Art der Quelle
Thema
- engineered materials, dielectrics and plasmas 10 Treffer
- logic gates 10 Treffer
- computing and processing 8 Treffer
- communication, networking and broadcast technologies 6 Treffer
- fields, waves and electromagnetics 6 Treffer
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45 weitere Werte:
- signal processing and analysis 6 Treffer
- degradation 5 Treffer
- mosfet 5 Treffer
- silicon 5 Treffer
- bioengineering 4 Treffer
- performance evaluation 3 Treffer
- power, energy and industry applications 3 Treffer
- transistors 3 Treffer
- cmos technology 2 Treffer
- computational efficiency 2 Treffer
- effective mass 2 Treffer
- engineering profession 2 Treffer
- finfets 2 Treffer
- indium gallium arsenide 2 Treffer
- integrated circuit modeling 2 Treffer
- mosfets 2 Treffer
- nuclear engineering 2 Treffer
- potential well 2 Treffer
- robotics and control systems 2 Treffer
- short channel effects 2 Treffer
- silicon-on-insulator 2 Treffer
- sram cells 2 Treffer
- transconductance 2 Treffer
- wireless sensor networks 2 Treffer
- aerospace 1 Treffer
- analytical models 1 Treffer
- channel estimation 1 Treffer
- cmos integrated circuits 1 Treffer
- computational modeling 1 Treffer
- conductivity 1 Treffer
- contact resistance 1 Treffer
- correlation 1 Treffer
- delays 1 Treffer
- device simulation 1 Treffer
- dielectric constant 1 Treffer
- dielectric devices 1 Treffer
- doping 1 Treffer
- double-gate fet 1 Treffer
- double-gate fets 1 Treffer
- electrostatic discharge 1 Treffer
- electrostatics 1 Treffer
- estimation 1 Treffer
- field effect transistors 1 Treffer
- finfet 1 Treffer
- fluctuations 1 Treffer
Publikation
- 2015 international symposium on vlsi technology, systems and applications, vlsi technology, systems and application (vlsi-tsa), 2015 international symposium on 2 Treffer
- 2003 ieee conference on electron devices and solid-state circuits (ieee cat. no.03th8668), electron devices and solid-state circuits, 2003 ieee conference on, electron devices and solid-state circuits 1 Treffer
- 2005 ieee conference on electron devices and solid-state circuits, electron devices and solid-state circuits, 2005 ieee conference on 1 Treffer
- 2012 ieee international soi conference (soi), soi conference (soi), 2012 ieee international 1 Treffer
- 2015 6th international conference on computers and devices for communication (codec), computers and devices for communication (codec), international conference on 1 Treffer
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8 weitere Werte:
- 2015 ieee 22nd international symposium on the physical and failure analysis of integrated circuits, physical and failure analysis of integrated circuits (ipfa), 2015 ieee 22nd international symposium on the 1 Treffer
- 2017 4th international conference on advances in electrical engineering (icaee), advances in electrical engineering (icaee), 2017 4th international conference on 1 Treffer
- 2018 33rd symposium on microelectronics technology and devices (sbmicro), microelectronics technology and devices (sbmicro), 2018 33rd symposium on 1 Treffer
- 2022 ieee 22nd international conference on nanotechnology (nano), nanotechnology (nano), 2022 ieee 22nd international conference on 1 Treffer
- 2022 international semiconductor conference (cas), semiconductor conference (cas), 2022 international 1 Treffer
- 69th device research conference, device research conference (drc), 2011 69th annual 1 Treffer
- 71st device research conference, device research conference (drc), 2013 71st annual 1 Treffer
- ieee access, access, ieee 1 Treffer
Inhaltsanbieter
14 Treffer
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In: 2022 International Semiconductor Conference (CAS), 2022-10-12, S. 247-250KonferenzZugriff:
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In: 2022 IEEE 22nd International Conference on Nanotechnology (NANO), 2022-07-04, S. 347-350KonferenzZugriff:
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In: 2018 33rd Symposium on Microelectronics Technology and Devices (SBMicro), 2018-08-01, S. 1-4KonferenzZugriff:
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In: 2017 4th International Conference on Advances in Electrical Engineering (ICAEE), 2017-09-01, S. 59-63KonferenzZugriff:
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In: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2015-06-01, S. 111-114KonferenzZugriff:
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In: 2015 6th International Conference on Computers and Devices for Communication (CODEC), 2015, S. 1-4KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 405-408KonferenzZugriff:
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In: 2003 IEEE Conference on Electron Devices and Solid-State Circuits (IEEE Cat. No.03TH8668), 2003, S. 251-254KonferenzZugriff:
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In: IEEE Access, Jg. 1 (2013), S. 201-215Online academicJournalZugriff:
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In: 2015 International Symposium on VLSI Technology, Systems and Applications, 2015-04-01, S. 1-2KonferenzZugriff:
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In: 2015 International Symposium on VLSI Technology, Systems and Applications, 2015-04-01, S. 1-2KonferenzZugriff:
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In: 71st Device Research Conference, 2013-06-01, S. 61-62KonferenzZugriff:
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In: 2012 IEEE International SOI Conference (SOI), 2012-10-01, S. 1-2KonferenzZugriff:
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In: 69th Device Research Conference, 2011-06-01, S. 233-234KonferenzZugriff: