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Weniger Treffer
Art der Quelle
Thema
- engineered materials, dielectrics and plasmas 3 Treffer
- fluctuations 3 Treffer
- circuit simulation 2 Treffer
- communication, networking and broadcast technologies 2 Treffer
- computing and processing 2 Treffer
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26 weitere Werte:
- mosfets 2 Treffer
- semiconductor process modeling 2 Treffer
- stability 2 Treffer
- wireless sensor networks 2 Treffer
- circuit noise 1 Treffer
- cmos technology 1 Treffer
- delay 1 Treffer
- doping 1 Treffer
- electrostatics 1 Treffer
- immune system 1 Treffer
- inverters 1 Treffer
- latches 1 Treffer
- libraries 1 Treffer
- logic gates 1 Treffer
- mosfet circuits 1 Treffer
- nanoscale devices 1 Treffer
- resource description framework 1 Treffer
- robotics and control systems 1 Treffer
- semiconductor device modeling 1 Treffer
- signal processing and analysis 1 Treffer
- static noise margin 1 Treffer
- subthreshold sram 1 Treffer
- temperature sensors 1 Treffer
- threshold voltage 1 Treffer
- transistors 1 Treffer
- variability 1 Treffer
Publikation
- 2005 ieee international soi conference proceedings, soi conference, 2005. proceedings. 2005 ieee international, soi conference 1 Treffer
- 2011 ieee international conference on ic design & technology, ic design & technology (icicdt), 2011 ieee international conference on 1 Treffer
- 2011 international electron devices meeting, electron devices meeting (iedm), 2011 ieee international 1 Treffer
- proceedings of 35th european solid-state device research conference, 2005. essderc 2005., solid-state device research conference, 2005. essderc 2005. proceedings of 35th european, solid-state device research conference 1 Treffer
Inhaltsanbieter
4 Treffer
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In: 2011 IEEE International Conference on IC Design & Technology, 2011-05-01, S. 1-4KonferenzZugriff:
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In: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC, 2005, S. 553-556KonferenzZugriff:
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In: 2005 IEEE International SOI Conference Proceedings, 2005, S. 61-62KonferenzZugriff:
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In: 2011 International Electron Devices Meeting, 2011-12-01, S. 1KonferenzZugriff: