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Thema
- analytical models 1 Treffer
- atlas 1 Treffer
- atomic layer deposition 1 Treffer
- atomic measurements 1 Treffer
- boundary conditions 1 Treffer
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14 weitere Werte:
- capacitance measurement 1 Treffer
- doping 1 Treffer
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- fields, waves and electromagnetics 1 Treffer
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- quantum capacitance 1 Treffer
- semiconductor films 1 Treffer
- semiconductor process modeling 1 Treffer
- temperature 1 Treffer
- threshold voltage 1 Treffer
- voltage 1 Treffer
Publikation
- 2007 international workshop on physics of semiconductor devices, physics of semiconductor devices, 2007. iwpsd 2007. international workshop on 1 Treffer
- 2009 10th international conference on ultimate integration of silicon, ultimate integration of silicon, 2009. ulis 2009. 10th international conference on 1 Treffer
Inhaltsanbieter
2 Treffer
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In: 2009 10th International Conference on Ultimate Integration of Silicon, 2009-03-01, S. 27KonferenzZugriff:
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In: 2007 International Workshop on Physics of Semiconductor Devices, 2007-12-01, S. 277KonferenzZugriff: