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Weniger Treffer
Art der Quelle
Thema
- components, circuits, devices and systems 12 Treffer
- mosfets 12 Treffer
- engineered materials, dielectrics and plasmas 11 Treffer
- logic gates 5 Treffer
- mathematical model 5 Treffer
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45 weitere Werte:
- silicon 5 Treffer
- substrates 5 Treffer
- drain-induced barrier lowering (dibl) 4 Treffer
- equations 4 Treffer
- cmos technology 3 Treffer
- fabrication 3 Treffer
- gate array circuits 3 Treffer
- mathematical models 3 Treffer
- metal oxide semiconductor field-effect transistors 3 Treffer
- semiconductor device modeling 3 Treffer
- semiconductor films 3 Treffer
- silicon-on-insulator technology 3 Treffer
- space charge 3 Treffer
- substrates (materials science) 3 Treffer
- thickness measurement 3 Treffer
- channel depth 2 Treffer
- charge carrier processes 2 Treffer
- cmos integrated circuits 2 Treffer
- computing and processing 2 Treffer
- degradation 2 Treffer
- doping 2 Treffer
- germanium silicon alloys 2 Treffer
- immune system 2 Treffer
- mosfet 2 Treffer
- mosfet circuits 2 Treffer
- silicides 2 Treffer
- silicon germanium 2 Treffer
- soi 2 Treffer
- threshold voltage 2 Treffer
- transistors 2 Treffer
- ultrathin body (utb) 2 Treffer
- work function 2 Treffer
- (110) 1 Treffer
- acoustic scattering 1 Treffer
- analytical models 1 Treffer
- applied sciences 1 Treffer
- capacitive sensors 1 Treffer
- carrier confinement 1 Treffer
- circuit couple 1 Treffer
- circuit integre 1 Treffer
- circuit simulation 1 Treffer
- circuit stability 1 Treffer
- circuito integrado 1 Treffer
- circuits electriques, optiques et optoelectroniques 1 Treffer
- circuits integres 1 Treffer
Publikation
- ieee electron device letters, electron device letters, ieee, ieee electron device lett. 3 Treffer
- ieee transactions on electron devices 3 Treffer
- ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices 2 Treffer
- 2002 ieee international soi conference (williamsburg va, 7-10 october 2002) 1 Treffer
- 2002 ieee international soi conference, soi conference, ieee international 2002, soi conference 1 Treffer
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7 weitere Werte:
- 2003 ieee international conference on soi, soi conference, 2003. ieee international, soi conference 1 Treffer
- 2005 ieee conference on electron devices and solid-state circuits, electron devices and solid-state circuits, 2005 ieee conference on 1 Treffer
- 2008 ieee international conference on integrated circuit design and technology and tutorial, integrated circuit design and technology and tutorial, 2008. icicdt 2008. ieee international conference on 1 Treffer
- 2009 10th international conference on ultimate integration of silicon, ultimate integration of silicon, 2009. ulis 2009. 10th international conference on 1 Treffer
- 7th international symposium on quality electronic design (isqed'06), quality electronic design, 2006. isqed '06. 7th international symposium on, quality electronic design 1 Treffer
- proceedings of the 8th spanish conference on electron devices, cde'2011, electron devices (cde), 2011 spanish conference on 1 Treffer
- proceedings. 7th international conference on solid-state and integrated circuits technology, 2004., solid-state and integrated circuits technology, 2004. proceedings. 7th international conference on, solid-state and integrated circuits technology 1 Treffer
Sprache
Inhaltsanbieter
13 Treffer
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In: Proceedings of the 8th Spanish Conference on Electron Devices, CDE'2011, 2011-02-01, S. 1-4KonferenzZugriff:
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In: 2005 IEEE Conference on Electron Devices and Solid-State Circuits, 2005, S. 405-408KonferenzZugriff:
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In: Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology,, Jg. 2 (2004), S. 995-998KonferenzZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 59 (2012), Heft 1, S. 247-251academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 27 (2006-04-01), Heft 4, S. 284-287academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 52 (2005-04-01), Heft 4, S. 561-568academicJournalZugriff:
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In: 2002 IEEE International SOI Conference, 2002, S. 176-178KonferenzZugriff:
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In: 2009 10th International Conference on Ultimate Integration of Silicon, 2009-03-01, S. 65KonferenzZugriff:
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In: 2008 IEEE International Conference on Integrated Circuit Design and Technology and Tutorial, 2008-06-01, S. 5KonferenzZugriff:
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In: IEEE Electron Device Letters, Jg. 26 (2005-11-01), Heft 11, S. 836-838academicJournalZugriff:
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In: IEEE Electron Device Letters, Jg. 26 (2005-09-01), Heft 9, S. 661-663academicJournalZugriff:
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In: 2003 IEEE International Conference on SOI, 2003, S. 70-71KonferenzZugriff:
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In: 7th International Symposium on Quality Electronic Design (ISQED'06), 2006, S. 1KonferenzZugriff: