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Weniger Treffer
Art der Quelle
Thema
- communication, networking and broadcast technologies 3 Treffer
- logic gates 3 Treffer
- signal processing and analysis 3 Treffer
- silicon 3 Treffer
- fields, waves and electromagnetics 2 Treffer
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29 weitere Werte:
- mosfets 2 Treffer
- power, energy and industry applications 2 Treffer
- algan/gan heterostructure 1 Treffer
- aluminum gallium nitride 1 Treffer
- bioengineering 1 Treffer
- correlation 1 Treffer
- dielectrics 1 Treffer
- effective mass 1 Treffer
- films 1 Treffer
- high-k 1 Treffer
- international electron devices meeting 1 Treffer
- low-field mobility 1 Treffer
- low-pressure chemical vapor deposition (lpcvd) 1 Treffer
- metals 1 Treffer
- nanoscale devices 1 Treffer
- passivation 1 Treffer
- performance evaluation 1 Treffer
- photonics and electrooptics 1 Treffer
- scattering 1 Treffer
- silicon germanium 1 Treffer
- silicon nitride 1 Treffer
- stoichiometry 1 Treffer
- stress 1 Treffer
- surface potential 1 Treffer
- surface treatment 1 Treffer
- tin 1 Treffer
- transistors 1 Treffer
- usa councils 1 Treffer
- wide band gap semiconductors 1 Treffer
Publikation
- 2008 ieee international workshop on design and test of nano devices, circuits and systems, design and test of nano devices, circuits and systems, 2008 ieee international workshop on 1 Treffer
- 2008 symposium on vlsi technology, vlsi technology, 2008 symposium on 1 Treffer
- 2011 international semiconductor device research symposium (isdrs), semiconductor device research symposium (isdrs), 2011 international 1 Treffer
- 69th device research conference, device research conference (drc), 2011 69th annual 1 Treffer
- ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices 1 Treffer
Inhaltsanbieter
5 Treffer
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In: IEEE Transactions on Electron Devices, Jg. 69 (2022-09-01), Heft 9, S. 4828-4834academicJournalZugriff:
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In: 2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems, 2008-09-01, S. 7KonferenzZugriff:
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In: 2008 Symposium on VLSI Technology, 2008-06-01, S. 36KonferenzZugriff:
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In: 2011 International Semiconductor Device Research Symposium (ISDRS), 2011-12-01, S. 1-2KonferenzZugriff:
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In: 69th Device Research Conference, 2011-06-01, S. 233-234KonferenzZugriff: