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Thema
- transistors 22 Treffer
- mosfet 21 Treffer
- transistor mosfet 21 Treffer
- evaluacion prestacion 9 Treffer
- evaluation performance 9 Treffer
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45 weitere Werte:
- performance evaluation 9 Treffer
- circuits integres 8 Treffer
- conception. technologies. analyse fonctionnement. essais 8 Treffer
- design. technologies. operation analysis. testing 8 Treffer
- integrated circuits 8 Treffer
- canal corto 7 Treffer
- canal court 7 Treffer
- comparative study 7 Treffer
- estudio comparativo 7 Treffer
- etude comparative 7 Treffer
- short channel 7 Treffer
- circuit integre 6 Treffer
- circuito integrado 6 Treffer
- ecuacion poisson 6 Treffer
- equation poisson 6 Treffer
- integrated circuit 6 Treffer
- poisson equation 6 Treffer
- analytical method 5 Treffer
- efecto cuantico 5 Treffer
- effet quantique 5 Treffer
- methode analytique 5 Treffer
- metodo analitico 5 Treffer
- modele 2 dimensions 5 Treffer
- modeling 5 Treffer
- modelisation 5 Treffer
- modelizacion 5 Treffer
- modelo 2 dimensiones 5 Treffer
- optics 5 Treffer
- optique 5 Treffer
- quantum effect 5 Treffer
- seuil tension 5 Treffer
- two dimensional model 5 Treffer
- umbral tension 5 Treffer
- voltage threshold 5 Treffer
- capa empobrecimiento 4 Treffer
- capa oxido 4 Treffer
- capacitance 4 Treffer
- capacitancia 4 Treffer
- capacite electrique 4 Treffer
- circuits integres par fonction (dont memoires et processeurs) 4 Treffer
- condensed state physics 4 Treffer
- couche appauvrissement 4 Treffer
- couche oxyde 4 Treffer
- depletion layer 4 Treffer
- dual gate transistor 4 Treffer
Verlag
Publikation
- solid-state electronics 10 Treffer
- i.e.e.e. transactions on electron devices 6 Treffer
- ieee electron device letters 5 Treffer
- semiconductor science and technology 4 Treffer
- 2002 ieee international soi conference (williamsburg va, 7-10 october 2002) 1 Treffer
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5 weitere Werte:
- 2005 ulis conference. selected papers 1 Treffer
- ieee transactions on nanotechnology 1 Treffer
- papers selected from the 35th european solid-state device research conference - essderc'05 1 Treffer
- selected full-length extended papers from the eurosoi 2009 conference 1 Treffer
- special issue with papers selected from the ultimate integration on silicon conference, ulis 2008 1 Treffer
Inhaltsanbieter
27 Treffer
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In: Solid-state electronics, Jg. 91 (2014), S. 28-35Online academicJournal
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In: Solid-state electronics, Jg. 95 (2014), S. 52-60Online academicJournal
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In: Papers selected from the 35th European Solid-State Device Research Conference - ESSDERC'05, Jg. 50 (2006), Heft 4, S. 660-667Online Konferenz
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In: 2005 ULIS Conference. Selected papers, Jg. 50 (2006), Heft 1, S. 86-93Online Konferenz
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In: I.E.E.E. transactions on electron devices, Jg. 60 (2013), Heft 4, S. 1485-1489academicJournalZugriff:
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In: IEEE transactions on nanotechnology, Jg. 12 (2013), Heft 4, S. 524-531academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 59 (2012), Heft 4, S. 941-948academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 59 (2012), Heft 1, S. 247-251academicJournalZugriff:
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In: I.E.E.E. transactions on electron devices, Jg. 58 (2011), Heft 3, S. 600-608academicJournalZugriff:
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In: Solid-state electronics, Jg. 57 (2011), Heft 1, S. 61-66Online academicJournal
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In: Selected Full-Length Extended Papers from the EUROSOI 2009 Conference, Jg. 54 (2010), Heft 2, S. 137-142Online academicJournal
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In: Solid-state electronics, Jg. 54 (2010), Heft 5, S. 545-551Online academicJournal
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In: Special Issue with Papers Selected from the Ultimate Integration on Silicon Conference, Ulis 2008, Jg. 53 (2009), Heft 4, S. 433-437Online academicJournal
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In: Solid-state electronics, Jg. 53 (2009), Heft 5, S. 540-547Online academicJournal
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In: I.E.E.E. transactions on electron devices, Jg. 55 (2008), Heft 5, S. 1203-1210academicJournalZugriff:
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In: Semiconductor science and technology, Jg. 22 (2007), Heft 5, S. 577-583academicJournalZugriff:
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In: IEEE electron device letters, Jg. 27 (2006), Heft 4, S. 284-287academicJournalZugriff:
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In: Semiconductor science and technology, Jg. 21 (2006), Heft 3, S. 261-266academicJournalZugriff:
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In: Solid-state electronics, Jg. 49 (2005), Heft 3, S. 479-483Online academicJournal
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In: I.E.E.E. transactions on electron devices, Jg. 52 (2005), Heft 4, S. 561-568academicJournalZugriff: