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Weniger Treffer
Art der Quelle
Thema
- business 58 Treffer
- business.industry 58 Treffer
- materials science 57 Treffer
- optoelectronics 49 Treffer
- mosfet 48 Treffer
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45 weitere Werte:
- electronic engineering 29 Treffer
- electrical and electronic engineering 27 Treffer
- electronic, optical and magnetic materials 26 Treffer
- electrical engineering 21 Treffer
- condensed matter physics 19 Treffer
- threshold voltage 19 Treffer
- chemistry 17 Treffer
- silicon 17 Treffer
- law 15 Treffer
- law.invention 15 Treffer
- chemistry.chemical_element 14 Treffer
- capacitance 13 Treffer
- materials chemistry 13 Treffer
- hardware_integratedcircuits 12 Treffer
- transistor 12 Treffer
- hardware_performanceandreliability 11 Treffer
- cmos 10 Treffer
- electron mobility 10 Treffer
- logic gate 10 Treffer
- physics 10 Treffer
- scaling 10 Treffer
- static random-access memory 10 Treffer
- 01 natural sciences 9 Treffer
- 0103 physical sciences 9 Treffer
- 010302 applied physics 9 Treffer
- 02 engineering and technology 9 Treffer
- voltage 9 Treffer
- communication channel 8 Treffer
- condensed matter::mesoscopic systems and quantum hall effect 8 Treffer
- 0210 nano-technology 7 Treffer
- 021001 nanoscience & nanotechnology 7 Treffer
- dopant 7 Treffer
- doping 7 Treffer
- silicon-on-insulator 7 Treffer
- subthreshold conduction 7 Treffer
- computational physics 6 Treffer
- engineering 6 Treffer
- high-κ dielectric 6 Treffer
- metal gate 6 Treffer
- dielectric 5 Treffer
- electronic circuit 5 Treffer
- equivalent series resistance 5 Treffer
- field-effect transistor 5 Treffer
- finfets 5 Treffer
- hardware_logicdesign 5 Treffer
Verlag
- ieee 38 Treffer
- institute of electrical and electronics engineers (ieee) 10 Treffer
- elsevier bv 9 Treffer
- iop publishing 3 Treffer
- the japan society of applied physics 3 Treffer
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9 weitere Werte:
- hal ccsd 2 Treffer
- springer science and business media llc 2 Treffer
- the electrochemical society 2 Treffer
- acm 1 Treffer
- acta physica sinica, chinese physical society and institute of physics, chinese academy of sciences 1 Treffer
- informa uk limited 1 Treffer
- korean physical society 1 Treffer
- springer netherlands 1 Treffer
- the korean institute of electrical and electronic material engineers 1 Treffer
Publikation
- solid-state electronics 9 Treffer
- ieee transactions on electron devices 8 Treffer
- ieee electron device letters 5 Treffer
- semiconductor science and technology 3 Treffer
- 2006 ieee international soi conferencee proceedings 2 Treffer
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40 weitere Werte:
- proceedings. 7th international conference on solid-state and integrated circuits technology, 2004. 2 Treffer
- 2003 ieee conference on electron devices and solid-state circuits (ieee cat. no.03th8668) 1 Treffer
- 2005 ieee conference on electron devices and solid-state circuits 1 Treffer
- 2005 ieee international soi conference proceedings 1 Treffer
- 2008 ieee international conference on integrated circuit design and technology and tutorial 1 Treffer
- 2008 ieee international conference on semiconductor electronics 1 Treffer
- 2009 10th international conference on ultimate integration of silicon 1 Treffer
- 2010 ieee international conference of electron devices and solid-state circuits (edssc) 1 Treffer
- 2011 ieee international conference on ic design & technology 1 Treffer
- 2011 international electron devices meeting 1 Treffer
- 2012 13th international conference on ultimate integration on silicon (ulis) 1 Treffer
- 2015 ieee 22nd international symposium on the physical and failure analysis of integrated circuits 1 Treffer
- 2015 ieee international conference on electron devices and solid-state circuits (edssc) 1 Treffer
- 2015 international symposium on vlsi technology, systems and applications 1 Treffer
- 2016 ieee computer society annual symposium on vlsi (isvlsi) 1 Treffer
- 2017 4th international conference on advances in electrical engineering (icaee) 1 Treffer
- 2018 33rd symposium on microelectronics technology and devices (sbmicro) 1 Treffer
- 2018 ieee 2nd electron devices technology and manufacturing conference (edtm) 1 Treffer
- 2018 international conference on applied electromagnetics, signal processing and communication (aespc) 1 Treffer
- 71st device research conference 1 Treffer
- 7th international symposium on quality electronic design (isqed'06) 1 Treffer
- acta physica sinica 1 Treffer
- ecs meeting abstracts 1 Treffer
- ecs transactions 1 Treffer
- extended abstracts of the 2002 international conference on solid state devices and materials 1 Treffer
- extended abstracts of the 2010 international conference on solid state devices and materials 1 Treffer
- extended abstracts of the 2016 international conference on solid state devices and materials 1 Treffer
- ieee international soi conference soi-02 1 Treffer
- ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices 1 Treffer
- ieee transactions on nanotechnology 1 Treffer
- international conference on simulation of semiconductor processes and devices, 2003. sispad 2003. 1 Treffer
- journal of computational electronics 1 Treffer
- journal of the korean institute of electrical and electronic material engineers 1 Treffer
- journal of the korean physical society 1 Treffer
- materials science in semiconductor processing 1 Treffer
- microsystem technologies 1 Treffer
- molecular simulation 1 Treffer
- proceedings of 35th european solid-state device research conference, 2005. essderc 2005. 1 Treffer
- proceedings of the 8th spanish conference on electron devices, cde'2011 1 Treffer
- ulis 2011 ultimate integration on silicon 1 Treffer
Sprache
Inhaltsanbieter
79 Treffer
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In: ECS Transactions, Jg. 18 (2009-03-06), S. 77-81Online unknownZugriff:
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In: Solid-State Electronics, Jg. 52 (2008-12-01), S. 1867-1871Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 55 (2008-05-01), S. 1203-1210Online unknownZugriff:
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In: Journal of Computational Electronics, Jg. 7 (2008-03-08), S. 168-171Online unknownZugriff:
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In: Molecular Simulation, Jg. 34 (2008), S. 63-72Online unknownZugriff:
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In: Journal of the Korean Institute of Electrical and Electronic Material Engineers, Jg. 20 (2007-11-01), S. 939-942Online unknownZugriff:
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In: Semiconductor Science and Technology, Jg. 22 (2007-04-23), S. 577-583Online unknownZugriff:
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In: 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC), 2015-06-01Online unknownZugriff:
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In: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2015-06-01Online unknownZugriff:
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In: 2015 International Symposium on VLSI Technology, Systems and Applications, 2015-04-01Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 27 (2006-04-01), S. 284-287Online unknownZugriff:
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In: Solid-State Electronics, Jg. 50 (2006-04-01), S. 660-667Online unknownZugriff:
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In: Semiconductor Science and Technology, Jg. 21 (2006-01-20), S. 261-266Online unknownZugriff:
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In: Solid-State Electronics, Jg. 50 (2006), S. 86-93Online unknownZugriff:
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In: IEEE Transactions on Electron Devices, Jg. 52 (2005-04-01), S. 561-568Online unknownZugriff:
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In: Solid-State Electronics, Jg. 49 (2005-03-01), S. 479-483Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 30 (2009-05-01), S. 541-543Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 29 (2008), S. 125-127Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 26 (2005-11-01), S. 836-838Online unknownZugriff:
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In: IEEE Electron Device Letters, Jg. 26 (2005-09-01), S. 661-663Online unknownZugriff: