Electron Mobility Behavior of Ge-Free Ultrathin-Body (UTB) Strained-SOI (sSOI) MOSFETs
In: Journal of the Korean Physical Society, Jg. 54 (2009-05-15), S. 1840-1843
Online
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Titel: |
Electron Mobility Behavior of Ge-Free Ultrathin-Body (UTB) Strained-SOI (sSOI) MOSFETs
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Autor/in / Beteiligte Person: | Kwan Su Kim ; Cho, Won-Ju |
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Zeitschrift: | Journal of the Korean Physical Society, Jg. 54 (2009-05-15), S. 1840-1843 |
Veröffentlichung: | Korean Physical Society, 2009 |
Medientyp: | unknown |
ISSN: | 0374-4884 (print) |
DOI: | 10.3938/jkps.54.1840 |
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