UTB GeOI 6T SRAM cell and sense amplifier considering BTI reliability
In: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2015
Online
Konferenz
Zugriff:
Titel: |
UTB GeOI 6T SRAM cell and sense amplifier considering BTI reliability
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Autor/in / Beteiligte Person: | Hu, Vita Pi-Ho ; Su, Pin ; Chuang, Ching-Te |
Link: | |
Zeitschrift: | 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2015 |
Veröffentlichung: | IEEE, 2015 |
Medientyp: | Konferenz |
DOI: | 10.1109/ipfa.2015.7224345 |
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