The Universal Microwave Test Probe System for Measurement of Monolithic Circuits Parameters and GaAs Transistors with Frequency Band Up to 20 GHz : Microwave and telecommunication technology
In: AD REPORTS -NTIS- AD A; S. 419-426
Konferenz
Zugriff:
Titel: |
The Universal Microwave Test Probe System for Measurement of Monolithic Circuits Parameters and GaAs Transistors with Frequency Band Up to 20 GHz : Microwave and telecommunication technology
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Autor/in / Beteiligte Person: | Ionov, V. E. ; Abolduyev, I. M. ; Zubkov, A. M. ; Dedinets, V. E. |
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Quelle: | AD REPORTS -NTIS- AD A; S. 419-426 |
Medientyp: | Konferenz |
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