Structural and temperature-related disordering studies of Cu6PS5I amorphous thin films
In: Thin solid films, Jg. 520 (2012), Heft 6, S. 1729-1733
Online
academicJournal
- print, 22 ref
Cu6PS5I thin films were deposited onto silicate glass substrates by non-reactive radio frequency magnetron sputtering. Spectrometric and isoabsorption studies of Cu6PS5I thin films in the temperature interval 77-500 K were performed. Structural studies were carried out using X-ray diffraction and scanning electron microscopy techniques. Temperature evolution of optical transmission spectra as well as temperature dependences of optical pseudogap and Urbach energy is investigated. The influence of temperature-related and structural disordering on the Urbach tail is studied.
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Structural and temperature-related disordering studies of Cu6PS5I amorphous thin films
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Autor/in / Beteiligte Person: | STUDENYAK, I. P ; KRANJCEC, M ; IZAI, V. Yu ; CHOMOLYAK, A. A ; VOROHTA, M ; MATOLIN, V ; CSERHATI, C ; KÖKENYESI, S |
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Zeitschrift: | Thin solid films, Jg. 520 (2012), Heft 6, S. 1729-1733 |
Veröffentlichung: | Amsterdam: Elsevier, 2012 |
Medientyp: | academicJournal |
Umfang: | print, 22 ref |
ISSN: | 0040-6090 (print) |
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