UTB SOI SRAM cell stability under the influence of intrinsic parameter fluctuation
In: Proceedings of ESSDERC 2005. 31st European Solid-State Device Research Conference; (2005) S. 553-556
Konferenz
Zugriff:
Titel: |
UTB SOI SRAM cell stability under the influence of intrinsic parameter fluctuation
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Autor/in / Beteiligte Person: | Samsudin, K. ; Cheng, B. ; Brown, A.R. ; Roy, S. ; Asenov, A. |
Quelle: | Proceedings of ESSDERC 2005. 31st European Solid-State Device Research Conference; (2005) S. 553-556 |
Veröffentlichung: | 2005 |
Medientyp: | Konferenz |
ISBN: | 0-7803-9203-5 (print) ; 978-0-7803-9203-8 (print) |
ISSN: | 1930-8876 (print) ; 2378-6558 (print) |
DOI: | 10.1109/ESSDER.2005.1546708 |
Sonstiges: |
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