Investigation and Comparison of Work Function Variation for FinFET and UTB SOI Devices Using a Voronoi Approach
In: IEEE Transactions on Electron Devices, Jg. 60 (2013-04-01), Heft 4, S. 1485-1489
academicJournal
Zugriff:
Titel: |
Investigation and Comparison of Work Function Variation for FinFET and UTB SOI Devices Using a Voronoi Approach
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Autor/in / Beteiligte Person: | Chou, S. H. ; Fan, M. L. ; Su, P. |
Zeitschrift: | IEEE Transactions on Electron Devices, Jg. 60 (2013-04-01), Heft 4, S. 1485-1489 |
Veröffentlichung: | 2013 |
Medientyp: | academicJournal |
ISSN: | 0018-9383 (print) ; 1557-9646 (print) |
DOI: | 10.1109/TED.2013.2248087 |
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