UTB GeOI 6T SRAM cell and sense amplifier considering BTI reliability
In: IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA); (2015-06-01) S. 111-114
Konferenz
Zugriff:
Titel: |
UTB GeOI 6T SRAM cell and sense amplifier considering BTI reliability
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Autor/in / Beteiligte Person: | Hu, Vita Pi-Ho ; Su, Pin ; Chuang, Ching-Te |
Quelle: | IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA); (2015-06-01) S. 111-114 |
Veröffentlichung: | 2015 |
Medientyp: | Konferenz |
ISBN: | 978-1-4799-9928-6 (print) |
ISSN: | 1946-1542 (print) ; 1946-1550 (print) |
DOI: | 10.1109/IPFA.2015.7224345 |
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