Gate Overdrive with Split-Circuit Biasing to Substitute for Body Biasing in FinFET and UTB FDSOI Circuits
In: IEEE Computer Society Annual Symposium on VLSI (ISVLSI); (2016-07-01) S. 467-472
Konferenz
Zugriff:
Titel: |
Gate Overdrive with Split-Circuit Biasing to Substitute for Body Biasing in FinFET and UTB FDSOI Circuits
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Autor/in / Beteiligte Person: | Whetzel, Andrew ; Stan, Mircea R. |
Quelle: | IEEE Computer Society Annual Symposium on VLSI (ISVLSI); (2016-07-01) S. 467-472 |
Veröffentlichung: | 2016 |
Medientyp: | Konferenz |
ISBN: | 978-1-4673-9039-2 (print) |
ISSN: | 2159-3477 (print) |
DOI: | 10.1109/ISVLSI.2016.136 |
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