Analysis of the Output Conductance Degradation With the Substrate Bias in SOI UTB and UTBB Transistors
In: 33rd Symposium on Microelectronics Technology and Devices (SBMicro); (2018-08-01) S. 1-4
Konferenz
Zugriff:
Titel: |
Analysis of the Output Conductance Degradation With the Substrate Bias in SOI UTB and UTBB Transistors
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Autor/in / Beteiligte Person: | Costa, F.J. ; Trevisoli, R. ; Doria, R.T. |
Quelle: | 33rd Symposium on Microelectronics Technology and Devices (SBMicro); (2018-08-01) S. 1-4 |
Veröffentlichung: | 2018 |
Medientyp: | Konferenz |
ISBN: | 978-1-5386-8391-0 (print) ; 978-1-5386-8390-3 (print) |
DOI: | 10.1109/SBMicro.2018.8511618 |
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