Performance Analysis of UTB and Nanowire Tunnel FET by varying various Device Intrinsic Parameters
In: Second International Conference on Electronics and Sustainable Communication Systems (ICESC); (2021-08-04) S. 522-529
Konferenz
Zugriff:
Titel: |
Performance Analysis of UTB and Nanowire Tunnel FET by varying various Device Intrinsic Parameters
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Autor/in / Beteiligte Person: | Joshi, Romil ; Shaherawala, Prutha ; Rana, Krishna ; Joshi, Krupa ; Parekh, Rutu |
Quelle: | Second International Conference on Electronics and Sustainable Communication Systems (ICESC); (2021-08-04) S. 522-529 |
Veröffentlichung: | 2021 |
Medientyp: | Konferenz |
ISBN: | 978-1-6654-2867-5 (print) ; 978-1-6654-2866-8 (print) |
DOI: | 10.1109/ICESC51422.2021.9532875 |
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