Impact of Temperature on the Reliability of UTB-DG-FE-TFETs and Their RF/Analog and Linearity Parameter Dependence
In: Journal of Electronic Materials, Jg. 52 (2023-09-01), Heft 9, S. 6293-6307
Online
academicJournal
Zugriff:
Titel: |
Impact of Temperature on the Reliability of UTB-DG-FE-TFETs and Their RF/Analog and Linearity Parameter Dependence
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Autor/in / Beteiligte Person: | Gopal, Girdhar ; Varma, Tarun |
Link: | |
Zeitschrift: | Journal of Electronic Materials, Jg. 52 (2023-09-01), Heft 9, S. 6293-6307 |
Veröffentlichung: | 2023 |
Medientyp: | academicJournal |
ISSN: | 0361-5235 (print) ; 1543-186X (print) |
DOI: | 10.1007/s11664-023-10556-x |
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